Meta-model Based Automation of Properties for Pre-Silicon Verification-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Meta-model Based Automation of Properties for Pre-Silicon Verification

Published:2018-10 Issue: Volume: Page:
ISSN:
Container-title:2018 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)
language:
Short-container-title:

Author:

Devarajegowda Keerthikumara,Ecker Wolfgang

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8642560/8644718/08644957.pdf?arnumber=8644957

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Synthetic Benchmark for Data-Driven Pre-Si Analogue Circuit Verification;Electronics;2024-07-02

2. Implementation of Smart Solar Power System Monitoring and Automated Cleaning Mechanism with Python based Embedded Technology;2023 4th International Conference on Intelligent Technologies (CONIT);2024-06-21

3. TIUP: Effective Processor Verification with Tautology-Induced Universal Properties;2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC);2024-01-22

4. Modelling Peripheral Designs using FSM-like Notation for Complete Property Set Generation;2023 IEEE 16th International Symposium on Embedded Multicore/Many-core Systems-on-Chip (MCSoC);2023-12-18

5. Adaptive Planning Search Algorithm for Analog Circuit Verification;2023 International Semiconductor Conference (CAS);2023-10-11

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP