Fault coverage analysis using fault model and functional testing for DPM reduction
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Published:2015-12
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Container-title:2015 International Conference on Emerging Research in Electronics, Computer Science and Technology (ICERECT)
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Author:
Thilak K R,Gayathri S.
Cited by
3 articles.
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1. An Automation Program for March Algorithm Fault Detection Analysis;2021 IEEE Asia Pacific Conference on Circuit and Systems (APCCAS);2021-11-22
2. Black-Box Test-Cost Reduction Based on Bayesian Network Models;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2021-02
3. Fault Tolerance in Reversible Logic Circuits and Quantum Cost Optimization;Computing and Informatics;2020