Testing dielectric slab mode excitation, non-rectangular conductor profiles and edge roughness as sources of additional loss in mmWave transmission lines
Author:
Affiliation:
1. NIST,Communications Technology Laboratory,USA
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10187888/10187785/10188190.pdf?arnumber=10188190
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1. A multiline method of network analyzer calibration
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3. Microwave and terahertz dielectric properties of single-crystalline scandate substrates for ferroic thin film deposition;bovtun;2013 23rd International Crimean Conference "Microwave & Telecommunication Technology" CriMiCo,2013
4. A general waveguide circuit theory
5. A Physical Surface Roughness Model and Its Applications
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2. Measuring the anisotropic permittivity tensor of DyScO3 to 110 GHz;Applied Physics Letters;2023-08-14
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