Accurate Measurement of the Linewidth Enhancement Factor of Semiconductor Lasers by a Simple Technique-Reference-Cited by-同舟云学术

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Accurate Measurement of the Linewidth Enhancement Factor of Semiconductor Lasers by a Simple Technique

Published:2023-06-26 Issue: Volume: Page:
ISSN:
Container-title:2023 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)
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Author:

Sinquin Brian¹,Romanelli Marco¹

Affiliation:

1. Univ. Rennes, CNRS, Institut FOTON UMR 6082,Rennes,France,F-35000

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10231377/10231353/10231566.pdf?arnumber=10231566

Reference6 articles.

1. Determination of the linewidth enhancement factor of semiconductor lasers by complete optical field reconstruction

2. Noise Correlation, Regenerative Amplification, and the Linewidth Enhancement Factor of a Vertical-Cavity Surface-Emitting Laser

3. Self-validating technique for the measurement of the linewidth enhancement factor in semiconductor lasers

4. Simple method for the complete characterization of an optical pulse

5. Low Phase Noise Direct-Modulation Optoelectronic Oscillator

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