A Bayesian Note on Reliability Growth During a Development Testing Program
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality
Link
http://xplorestaging.ieee.org/ielx5/24/5220174/05220195.pdf?arnumber=5220195
Cited by 29 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Space Product Reliability Evaluation in Two-stage Development Based on Scaling Factor;IEEE Access;2020
2. Natural Reliability Growth Trend Test Application on Electromechanical System;2019 4th International Conference on System Reliability and Safety (ICSRS);2019-11
3. Bayesian reliability assessment and degradation modeling with calibrations and random failure threshold;Journal of Shanghai Jiaotong University (Science);2016-08
4. The Bayesian Reliability Assessment and Prediction for Radar System Based on New Dirichlet Prior Distribution;Journal of Physics: Conference Series;2016-02-29
5. Planning, tracking and projecting method for testability growth based on in time correction;Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability;2016-02-03
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