Characterization techniques for temperature-dependent experimental analysis of microwave transistors-Reference-Cited by-同舟云学术

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Characterization techniques for temperature-dependent experimental analysis of microwave transistors

Published:2003-02 Issue:1 Volume:52 Page:85-91
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:en
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Caddemi A.,Donato N.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx5/19/26700/01191413.pdf?arnumber=1191413

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Influence of Raised Ambient Temperature on a Sensor Node Using Step-Stress Test;IEEE Transactions on Instrumentation and Measurement;2020-12

2. NONLINEAR MODELING OF TRAPPING AND THERMAL EFFECTS ON GaAs AND GaN MESFET/HEMT DEVICES;Progress In Electromagnetics Research;2012

3. Temperature effects on DC and small signal RF performance of AlGaAs/GaAs HEMTs;Microelectronics Reliability;2006-01

4. Analysis of the input noise contribution in the noise temperature measurements;IEEE Microwave and Wireless Components Letters;2005-03

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