The One-vs-Rest Method for a Multilabel Patent Classification Machine Learning Approach using a Regression Model-Reference-Cited by-同舟云学术

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The One-vs-Rest Method for a Multilabel Patent Classification Machine Learning Approach using a Regression Model

Published:2023-11-07 Issue: Volume: Page:
ISSN:
Container-title:2023 International Conference on Informatics, Multimedia, Cyber and Informations System (ICIMCIS)
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Author:

Widodo Slamet¹,Ermatita ²,Stiawan Deris²,Pradnyana I Wayan Widi³

Affiliation:

1. Universitas Sriwijaya,Politeknik Negeri Sriwijaya Faculty of Engineering,Department of Computer Engineering,Palembang,Indonesia,30139

2. University of Sriwijaya,Faculty of Engineering,Palembang,Indonesia,30139

3. University of Pembangunan Nasional Veteran Jakarta,Information System Program,Jakarta,Indonesia

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10348961/10348616/10348993.pdf?arnumber=10348993

Reference24 articles.

1. A Supervised Requirement-oriented Patent Classification Scheme Based on the Combination of Metadata and Citation Information

2. Characterizing patent big data upon IPC: a survey of triadic patent families and PCT applications

3. DeepPatent: patent classification with convolutional neural networks and word embedding

4. Parameter tuning Naïve Bayes for automatic patent classification

5. Local and global feature selection for multilabel classification with binary relevance

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1. Automatic lithology identification in meteorite impact craters using machine learning algorithms;Scientific Reports;2024-06-21

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