Degradation and Recovery of NMOS Subthreshold Leakage Current by Off-state Hot Carrier Stress
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Published:2006-04
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Container-title:2006 International Caribbean Conference on Devices, Circuits and Systems
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Author:
Yang Z.,Guarin F.
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1 articles.
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1. Anomalous NMOSFET hot carrier degradation on DRAM;2021 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA);2021-11-24