Author:
Suehle J. S.,Russell T. J.,Galloway K. F.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
1 articles.
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1. Hot carrier reliability of radiation hardened T-gate PD SOI NMOSFET after TID radiation;Fifth Symposium on Novel Optoelectronic Detection Technology and Application;2019-03-12