Mechanical and Optical Investigations of Cr Thin Films Deposited on Si Substrate-Reference-Cited by-同舟云学术

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Mechanical and Optical Investigations of Cr Thin Films Deposited on Si Substrate

Published:2023-07-02 Issue: Volume: Page:
ISSN:
Container-title:2023 23rd International Conference on Transparent Optical Networks (ICTON)
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Author:

Tranca Denis E.¹,Sobetkii Arcadie²,Hristu Radu¹,Anton Stefan R.¹,Stanciu Stefan G.¹,Fiorentis Efstathios¹,Vasile Eugeniu³,Banica Cosmin K.⁴,Stanciu George A.¹

Affiliation:

1. University Politehnica of Bucharest,Center for Microscopy-Microanalysis and Information Processing,Bucharest,Romania,060042

2. MGM Star Construct SRL,Bucharest,Romania,02277

3. University Politehnica of Bucharest,Faculty of Chemical Engineering and Biotechnologies,Department of Science and Engineering of Oxide Materials and Nanomaterials,Bucharest,Romania,060042

4. University Politehnica of Bucharest,Faculty of Electrical Engineering,Bucharest,Romania,060042

Funder

Ministry of Education

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10207167/10207171/10207526.pdf?arnumber=10207526

Reference9 articles.

1. Mapping electron-beam-injected trapped charge with scattering scanning near-field optical microscopy

2. Nanoscale mapping of refractive index by using scattering-type scanning near-field optical microscopy

3. Electron beam influence on the carbon contamination of electron irradiated hydroxyapatite thin films

4. Optical properties of metallic nanoparticles: manipulating light, heat and forces at the nanoscale

5. Selective Surfaces of Black Chromium for Use in Solar Absorbers

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