Investigation of ramp-type Josephson junctions with surface-modified barriers

Author:

Soutome Y.,Hanson R.,Fukazama T.,Saitoh K.,Tsukamoto A.,Tarutani Y.,Takagi K.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Cited by 34 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Edge-type Josephson junctions with Co-doped Ba-122 thin films;Superconductor Science and Technology;2012-07-17

2. High quality factor HTS Josephson junctions on low loss substrates;Superconductor Science and Technology;2011-02-04

3. Superconducting characterization of Ni/Bi2Sr2Ca2Cu3Oy superconductors;Physica C: Superconductivity and its Applications;2007-10

4. Superconducting characterization of non-superconductors/high-TC cuprate superconductors;Physica C: Superconductivity and its Applications;2005-10

5. Analysis of the Barrier in Vertically-Stacked Interface-Treated Josephson Junctions;IEEE Transactions on Appiled Superconductivity;2005-06

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