Edge-Eye: Rectifying Millimeter-level Edge Deviation in Manufacturing using Camera-enabled IoT Edge Device-Reference-Cited by-同舟云学术

Edge-Eye: Rectifying Millimeter-level Edge Deviation in Manufacturing using Camera-enabled IoT Edge Device

Published:2022-05 Issue: Volume: Page:
ISSN:
Container-title:2022 21st ACM/IEEE International Conference on Information Processing in Sensor Networks (IPSN)
language:
Short-container-title:

Author:

Chu Zihao¹,Xie Lei¹,Gu Tao²,Bu Yanling¹,Wang Chuyu¹,Lu Sanglu¹

Affiliation:

1. State Key Laboratory for Novel Software Technology, Nanjing University,Nanjing,China

2. School of Computing, Macquarie University,Sydney,Australia

Funder

National Natural Science Foundation of China

Jiangsu Natural Science Foundation

Key K&D Program of Jiangsu Province

Nanjing University

Australian Research Council (ARC) Discovery

Publisher

IEEE

Link

Reference22 articles.

3. Reconstructive sparse code transfer for contour detection and semantic labeling;maire;Asian Conference on Computer Vision,2014

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

2. BubCam: A Vision System for Automated Quality Inspection at Manufacturing Lines;Proceedings of the ACM/IEEE 14th International Conference on Cyber-Physical Systems (with CPS-IoT Week 2023);2023-05-09