Accelerating Electromigration Stress Analysis Using Low-Rank Balanced Truncation-Reference-Cited by-同舟云学术

Accelerating Electromigration Stress Analysis Using Low-Rank Balanced Truncation

Published:2022-06-12 Issue: Volume: Page:
ISSN:
Container-title:2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)
language:
Short-container-title:

Author:

Axelou Olympia¹,Floros George¹,Evmorfopoulos Nestor¹,Stamoulis George¹

Affiliation:

1. University of Thessaly,Department of Electrical and Computer Engineering,Volos,Greece

Funder

European Regional Development Fund

Publisher

IEEE

Link

Reference15 articles.

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Fast Electromigration Stress Evolution Analysis Based on Relative Gain Array;2024 2nd International Symposium of Electronics Design Automation (ISEDA);2024-05-10

3. An Optimal Methodology for EM-Based Hardware Trojan Placement on Clock Tree Networks;2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS);2023-08-06

4. PROTON – A Python Framework for Physics-Based Electromigration Assessment on Contemporary VLSI Power Grids;2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD);2023-07-03

5. Electromigration Stress Analysis with Rational Krylov-based Approximation of Matrix Exponential;2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD);2023-07-03