Variation in Transistor Performance and Leakage in Nanometer-Scale Technologies-Reference-Cited by-同舟云学术

Variation in Transistor Performance and Leakage in Nanometer-Scale Technologies

Published:2008-01 Issue:1 Volume:55 Page:131-144
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Saxena Sharad,Hess Christopher,Karbasi Hossein,Rossoni Angelo,Tonello Stefano,McNamara Patrick,Lucherini Silvia,Minehane SeÁn,Dolainsky Christoph,Quarantelli Michele

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/16/4408767/04408809.pdf?arnumber=4408809

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