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Analog/RF Performance of Si Nanowire MOSFETs and the Impact of Process Variation

  • Published:2007-06 Issue:6 Volume:54 Page:1288-1294
  • ISSN:0018-9383
  • Container-title:IEEE Transactions on Electron Devices
  • language:
  • Short-container-title:IEEE Trans. Electron Devices

Author:

Runsheng Wang ,Jing Zhuge ,Ru Huang ,Yu Tian ,Han Xiao ,Liangliang Zhang ,Chen Li ,Xing Zhang ,Yangyuan Wang

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

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