Condition Assessment of Insulation Systems Through Electric Field Mapping Using Electro-Optic Sensors-Reference-Cited by-同舟云学术

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Condition Assessment of Insulation Systems Through Electric Field Mapping Using Electro-Optic Sensors

Published:2024-06-30 Issue: Volume: Page:1-4
ISSN:
Container-title:2024 IEEE 5th International Conference on Dielectrics (ICD)
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Author:

Hegde Sneha Satish¹,Gaborit Gwenaël²,Zouaghi Ayyoub¹,Duvillaret Lionel³,Vollaire Christian¹

Affiliation:

1. Ecole Centrale de Lyon, INSA Lyon, Universite Claude Bernard Lyon 1,Ecully,France,69130

2. Université Savoie- Mont-Blanc,CROMA laboratory,Le Bourget-du-Lac cedex,France,73376

3. Kapteos SAS, Bât. Cleanspace 354 voie Magellan, Z.A. Alpespace,Sainte-Hélène-du-Lac,France,73800

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx8/10613003/10613009/10613258.pdf?arnumber=10613258

Reference11 articles.

1. Contamination Level Monitoring Techniques for High-Voltage Insulators: A Review

2. Comparative performance of insulating materials used in high voltage insulators

3. Impact of superficial and internal defects on electric field of composite insulators

4. A new procedure for determination of insulators contamination in electrical distribution networks

5. New method for in live-line detection of small defects in composite insulator based on electro-optic E-field sensor

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