Limits of integrated-circuit manufacturing

Author:

Doering R.,Nishi Y.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Cited by 19 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

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4. Introduction;Long-Term Reliability of Nanometer VLSI Systems;2019

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