An Intelligent Factory Automation System With Multivariate Time Series Algorithm for Chip Probing Process-Reference-Cited by-同舟云学术

An Intelligent Factory Automation System With Multivariate Time Series Algorithm for Chip Probing Process

Published:2023-09 Issue:9 Volume:8 Page:5464-5471
ISSN:2377-3766
Container-title:IEEE Robotics and Automation Letters
language:
Short-container-title:IEEE Robot. Autom. Lett.

Author:

Hsieh Yu-Ming¹^ORCID,Lin Chin-Yi²^ORCID,Wilch Jan³^ORCID,Vogel-Heuser Birgit³^ORCID,Lin Yu-Chen²,Lin Yu-Chuan²^ORCID,Hung Min-Hsiung⁴^ORCID,Cheng Fan-Tien²^ORCID

Affiliation:

1. Academy of Innovative Semiconductor and Sustainable Manufacturing, National Cheng Kung University, Tainan, Taiwan

2. Institute of Manufacturing Information and Systems, National Cheng Kung University, Tainan, Taiwan

3. Institute of Automation and Information Systems, Technical University of Munich, Garching, Germany

4. Department of Computer Science and Information Engineering, Chinese Culture University, Taipei, Taiwan

Funder

Intelligent Manufacturing Research Center

Featured Areas Research Center Program

Higher Education Sprout Project by the Ministry of Education

National Science and Technology Council

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Artificial Intelligence,Control and Optimization,Computer Science Applications,Computer Vision and Pattern Recognition,Mechanical Engineering,Human-Computer Interaction,Biomedical Engineering,Control and Systems Engineering

Link

http://xplorestaging.ieee.org/ielx7/7083369/10185095/10182293.pdf?arnumber=10182293

Reference19 articles.

1. Selection of the order of an autoregressive model by Akaike's information criterion

2. Investigating Causal Relations by Econometric Models and Cross-spectral Methods

3. Macroeconomics and Reality

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