Author:
Crouch Al,Laisne Michael,Keim Martin
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Cited by
6 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Refreshing the JTAG Family;2023 IEEE 41st VLSI Test Symposium (VTS);2023-04-24
2. IEEE P1687.1: Extending the Network Boundaries for Test;2022 IEEE International Test Conference (ITC);2022-09
3. Accessing general IEEE Std. 1687 networks via functional ports;2021 IEEE International Test Conference (ITC);2021-10
4. System-Level Access to On-Chip Instruments;2021 IEEE European Test Symposium (ETS);2021-05-24
5. Multi-Level Access Protection for Future IEEE P1687.1 IJTAG Networks;2020 IEEE International Test Conference (ITC);2020-11-01