Automatic TFT-LCD mura detection based on image reconstruction and processing
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/6697948/6697949/06698053.pdf?arnumber=6698053
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Machine-learning-based sampling inspection under OQC capacity for real-time quality monitoring in the TFT-LCD industry;International Journal of Production Research;2024-08-27
2. Automatic Labeling in Image Segmentation and Classification for TFT-LCD Manufacturing;2022 IEEE International Conference on Mechatronics and Automation (ICMA);2022-08-07
3. Deep-Learning-Enabled Automatic Optical Inspection for Module-Level Defects in LCD;IEEE Internet of Things Journal;2022-01-15
4. A Generative Adversarial Network Based Deep Learning Method for Low-Quality Defect Image Reconstruction and Recognition;IEEE Transactions on Industrial Informatics;2021-05
5. A Mura Detection Method Based on an Improved Generative Adversarial Network;IEEE Access;2021
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