Single-electron charging effects and implications for tunneling measurements of the high-T/sub c/ superconductors-Reference-Cited by-同舟云学术

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Single-electron charging effects and implications for tunneling measurements of the high-T/sub c/ superconductors

Published:1989-03 Issue:2 Volume:25 Page:2542-2545
ISSN:0018-9464
Container-title:IEEE Transactions on Magnetics
language:
Short-container-title:IEEE Trans. Magn.

Author:

Barner J.B.,Mullen K.,Honkanen M.J.,Ruggiero S.T.,Ben-Jacob E.,Pelton A.R.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx1/20/3041/00092824.pdf?arnumber=92824

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. STM control of noninteger residual charge Q/sub 0/ on the central electrode of a double-tunnel junction;IEEE Transactions on Magnetics;1992

2. Dynamik einer Anordnung aus zwei Tunnelkontakten ultrakleiner Kapazität mit supraleitenden Elektroden;Annalen der Physik;1992

3. Model for phonon transmission through a NbN grain-size distribution: Comparison with tunneling-spectroscopy observations;Physical Review B;1990-12-15

4. Studies of proximity-effect and tunneling in YBCO/metal layered films;Physica C: Superconductivity and its Applications;1989-12

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