A New Resonance Phenomenon Observed in UWB 14–50 GHz SAR and Its Application to the Retrieval of Thickness and Dielectric Properties of Scene Features-Reference-Cited by-同舟云学术

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A New Resonance Phenomenon Observed in UWB 14–50 GHz SAR and Its Application to the Retrieval of Thickness and Dielectric Properties of Scene Features

Published:2021-04 Issue:2 Volume:57 Page:897-906
ISSN:0018-9251
Container-title:IEEE Transactions on Aerospace and Electronic Systems
language:
Short-container-title:IEEE Trans. Aerosp. Electron. Syst.

Author:

Morrison Keith,Andre Daniel,Bennett John,Finnis Mark,Blacknell David,Muff Darren,Nottingham Matt,Stevenson Claire

Funder

Defence Science and Technology Laboratory

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Aerospace Engineering

Link

http://xplorestaging.ieee.org/ielx7/7/9399890/09241046.pdf?arnumber=9241046

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