Robust Time-of-Flight-based Material Imaging using Three-Dimensional Deep Neural Networks on Spatial Neighborhoods of Pixels
Author:
Affiliation:
1. Center for Sensor Systems (ZESS), University of Siegen,Siegen,Germany
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9966996/9966997/09967293.pdf?arnumber=9967293
Reference25 articles.
1. Material Classification Using Frequency-and Depth-Dependent Time-of-Flight Distortion
2. Image classification in natural scenes: Are a few selective spectral channels sufficient?
3. Single view reflectance capture using multiplexed scattering and time-of-flight imaging
4. Material Identification Using RF Sensors and Convolutional Neural Networks
5. Low-cost SPAD sensing for non-line-of-sight tracking, material classification and depth imaging
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