Investigation of Parasitic Background IR Radiation Levels on a Photodetector Surface in a Vacuum Cryostat-Reference-Cited by-同舟云学术

Investigation of Parasitic Background IR Radiation Levels on a Photodetector Surface in a Vacuum Cryostat

Published:2022-11-11 Issue: Volume: Page:
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Container-title:2022 IEEE International Multi-Conference on Engineering, Computer and Information Sciences (SIBIRCON)
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Author:

Novoselov Andrew R.¹,Dobrovolsky Peters P.¹,Khryashchev Sergey V.²,Shatunov Konstantin P.¹,Aldokhin Pavel A.¹

Affiliation:

1. Academy of Sciences, "Technology and Design Institute of Applied Microelectronics",Novosibirsk Branch of Rzhanov Institute of Semiconductor Physics, Siberian Branch of the Russian,Dept. of Thermal Imaging and Television,Novosibirsk,Russian Federation

2. Academy of Sciences, "Technology and Design Institute of Applied Microelectronics",Novosibirsk Branch of Rzhanov Institute of Semiconductor Physics, Siberian Branch of the Russian,Dept. of Modeling of Electrooptical Devices,Novosibirsk,Russian Federation

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10016894/10016776/10016953.pdf?arnumber=10016953

Reference10 articles.

1. Design and manufacturing technology of VVC and docking with GCM. Course of lectures;kuznetsov;M Research Technological University "MIS and S",2021

2. The development results of modular micro cryogenic systems based on the Split-Stirling for cryostatting of the first and second generation photodetective assembly;lipin;Applied Physics,2007

3. Specific structure of cryostatic systems based on gas cryogenic engines;demyanov;Microsystem Technology,2001

4. Method and apparatus for cold shielding;clynne;US Patent,1999

5. Consideration is made to a state and problems of photodetective assemblies based on IR focal plane arrays;boroshnev;Applied Physics,2007

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