Improving After-the-Fact Tracing and Mapping: Supporting Software Quality Predictions
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Software
Link
http://xplorestaging.ieee.org/ielx5/52/32609/01524912.pdf?arnumber=1524912
Cited by 24 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
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