An O(n·(log/sub 2/(n))/sup 2/) algorithm for computing the reliability of k-out-of-n:G and k-to-l-out-of-n:G systems
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality
Link
http://xplorestaging.ieee.org/ielx1/24/8586/00376535.pdf?arnumber=376535
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