Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
32 articles.
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1. Impact of 40 Years of Technology Advances on EDS System Performance;Microscopy and Microanalysis;2009-10-06
2. Low noise JFETs for room temperature x-ray detectors;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1996-10
3. “Gate-to-gate” BJT obtained from the double-gate input JFET to reset charge preamplifiers;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1996-08
4. Problems and Trends in X-Ray Detector Design for Microanalysis;X-Ray Spectrometry in Electron Beam Instruments;1995
5. Chapter 14 Electronics for X-Ray and Gamma Ray Spectrometers;Semiconductors for Room Temperature Nuclear Detector Applications;1995