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Improving Hot Carrier Reliability of Organic-TFTs by Extended Electrode

  • Published:2023-04 Issue:4 Volume:44 Page:626-629
  • ISSN:0741-3106
  • Container-title:IEEE Electron Device Letters
  • language:
  • Short-container-title:IEEE Electron Device Lett.

Author:

Hung Wei-Chun1ORCID,Lin Jia-Hong1,Chang Ting-Chang2ORCID,Zheng Yu-Zhe3,Hung Yang-Hao1,Chen Yu-An1,Wang Li-Wen4,Tsai Chia-Hung5ORCID,Ogier Simon5ORCID

Affiliation:

1. Department of Physics, National Sun Yat-sen University, Kaohsiung, Taiwan

2. Department of Physics, Center of Crystal Research, and the College of Semiconductor and Advanced Technology Research, National Sun Yat-sen University, Kaohsiung, Taiwan

3. Department of Photonics, National Sun Yat-sen University, Kaohsiung, Taiwan

4. Department of Electrical Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan

5. SmartKem Ltd, Manchester, U.K

Funder

SmartKem Ltd., Manchester Technology Center

National Sun Yat-sen University Joint Center for high value Instruments

National Science and Technology Council

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

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