A Global Shutter Wide Dynamic Range Soft X-Ray CMOS Image Sensor With Backside- Illuminated Pinned Photodiode, Two-Stage Lateral Overflow Integration Capacitor, and Voltage Domain Memory Bank-Reference-Cited by-同舟云学术

A Global Shutter Wide Dynamic Range Soft X-Ray CMOS Image Sensor With Backside- Illuminated Pinned Photodiode, Two-Stage Lateral Overflow Integration Capacitor, and Voltage Domain Memory Bank

Published:2021-04 Issue:4 Volume:68 Page:2056-2063
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Shike Hiroya,Kuroda Rihito,Kobayashi Ryota,Murata Maasa,Fujihara Yasuyuki,Suzuki Manabu,Harada Shoma,Shibaguchi Taku,Kuriyama Naoya,Hatsui Takaki,Miyawaki Jun,Harada Tetsuo,Yamasaki Yuichi,Watanabe Takeo,Harada Yoshihisa,Sugawa Shigetoshi

Funder

SACLA Basic Development Program 2020

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/16/9385809/09378940.pdf?arnumber=9378940

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