The Use of Microprocessor Trace Infrastructures for Radiation-Induced Fault Diagnosis-Reference-Cited by-同舟云学术

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The Use of Microprocessor Trace Infrastructures for Radiation-Induced Fault Diagnosis

Published:2020-01 Issue:1 Volume:67 Page:126-134
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Pena-Fernandez M.^ORCID,Lindoso A.^ORCID,Entrena L.^ORCID,Garcia-Valderas M.

Funder

Ministerio de Economía y Competitividad

Comunidad de Madrid

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx7/23/8974631/08915730.pdf?arnumber=8915730

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Hang features of microcontroller exposed to pulsed ionizing radiation;Microelectronics Reliability;2023-10

2. Assessing Convolutional Neural Networks Reliability through Statistical Fault Injections;2023 Design, Automation & Test in Europe Conference & Exhibition (DATE);2023-04

3. High complexity reliable space applications in commercial microprocessors;Microelectronics Reliability;2022-11

4. Observation framework of errors in microprocessors with machine learning location inference of radiation-induced faults;Microelectronics Reliability;2022-10

5. Bridging RHA Methodology From Component to System Level Applied to System-on-Modules;IEEE Transactions on Nuclear Science;2022-07

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