Development and Characterization of New 256$\,\times\,$256 Pixel DEPFET Detectors for X-Ray Astronomy-Reference-Cited by-同舟云学术

Development and Characterization of New 256$\,\times\,$256 Pixel DEPFET Detectors for X-Ray Astronomy

Published:2011-06 Issue:3 Volume:58 Page:1206-1211
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Meuris Aline,Aschauer Florian,De Vita Giulio,Guenther Bettina,Herrmann Sven,Lauf Thomas,Lechner Peter,Lutz Gerhard,Majewski Petra,Miessner Danilo,Porro Matteo,Reiffers Jonas,Stefanescu Alexander,Schopper Florian,Soltau Heike,Strueder Lothar,Treis Johannes

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx5/23/5875999/05753974.pdf?arnumber=5753974

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3. Spectral performance of DEPFET and gateable DEPFET macropixel devices;Journal of Instrumentation;2014-03-31

4. Development and characterization of the latest X-ray SOI pixel sensor for a future astronomical mission;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2013-12

5. DEPFET Macropixel Detectors for MIXS: Integration and Qualification of the Flight Detectors;IEEE Transactions on Nuclear Science;2012-10