Growth and Characterization of CZT Crystals by the Vertical Bridgman Method for X-Ray Detector Applications-Reference-Cited by-同舟云学术

Growth and Characterization of CZT Crystals by the Vertical Bridgman Method for X-Ray Detector Applications

Published:2011-10 Issue:5 Volume:58 Page:2352-2356
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Zappettini Andrea,Marchini Laura,Zha Mingzheng,Benassi Giacomo,Zambelli Nicola,Calestani Davide,Zanotti Lucio,Gombia Enos,Mosca Roberto,Zanichelli Massimiliano,Pavesi Maura,Auricchio Natalia,Caroli Ezio

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx5/23/6041076/06025230.pdf?arnumber=6025230

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