Author:
Chang-Hoon Choi ,Zhiping Yu ,Dutton R.W.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Cited by
2 articles.
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1. Device Modeling: From Physics to Electrical Parameter Extraction;Electronic Design Automation for IC Implementation, Circuit Design, and Process Technology;2016-04-14
2. Modeling the Inelastic Scattering Effect on the Resonant Tunneling Current;Journal of Computational Electronics;2007-01-18