An Experimental Study of Block-Oxide Source/Drain-Tied Polycrystalline-Silicon Thin-Film Transistors With Additional Polycrystalline-Silicon Body
-
Published:2012-12
Issue:12
Volume:59
Page:3377-3381
-
ISSN:0018-9383
-
Container-title:IEEE Transactions on Electron Devices
-
language:
-
Short-container-title:IEEE Trans. Electron Devices
Author:
Lin Jyi-Tsong,Eng Yi-Chuen,Fan Yi-Hsuan
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials