Self-checking circuits versus realistic faults in very deep submicron

Author:

Anghel L.,Nicolaidis M.,Alzaher-Noufal I.

Publisher

IEEE Comput. Soc

Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Circuit-Level Soft-Error Mitigation;Soft Errors in Modern Electronic Systems;2010-08-23

2. Concurrent checking with split-parity codes;2009 15th IEEE International On-Line Testing Symposium;2009-06

3. Energy-efficient soft error-tolerant digital signal processing;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2006-04

4. Design for soft error mitigation;IEEE Transactions on Device and Materials Reliability;2005-09

5. On-line testing of transient and crosstalk faults affecting interconnections of FPGA-implemented systems;Proceedings International Test Conference 2001 (Cat. No.01CH37260)

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