Author:
Dong Xiang ,Yi Xu ,Fujiwara H.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software
Cited by
17 articles.
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1. Functional Compaction for Functional Test Sequences;IEEE Access;2024
2. Diagnostic Test Point Insertion and Test Compaction;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-02
3. SPAR: A New Test-Point Insertion Using Shared Points for Area Overhead Reduction;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022-11
4. Topological Heuristics for Scan Test Overhead Reduction;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022
5. Invisible-Scan: A Design-for-Testability Approach for Functional Test Sequences;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2019-12