An Automated Framework for Variability Analysis for Integrated Circuits Using Metaheuristics
Author:
Affiliation:
1. Department of Electrical Engineering, Indian Institute of Technology Jodhpur, Jodhpur, India
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Link
http://xplorestaging.ieee.org/ielx7/9745882/9770004/09869311.pdf?arnumber=9869311
Reference25 articles.
1. Bayesian Methods for the Yield Optimization of Analog and SRAM Circuits
2. UQLab: A Framework for Uncertainty Quantification in Matlab
3. A Global Bayesian Optimization Algorithm and Its Application to Integrated System Design
4. An Efficient Optimization Based Method to Evaluate the DRV of SRAM Cells
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