Heavy Ion Testing With Iron at 1 GeV/amu

Author:

Pellish Jonathan A.,Xapsos Michael A.,LaBel Kenneth A.,Marshall Paul W.,Heidel David F.,Rodbell Kenneth P.,Hakey Mark C.,Dodd Paul E.,Shaneyfelt Marty R.,Schwank James R.,Baumann Robert C.,Deng Xiaowei,Marshall Andrew,Sierawski Brian D.,Black Jeffrey D.,Reed Robert A.,Schrimpf Ronald D.,Kim Hak S.,Berg Melanie D.,Campola Michael J.,Friendlich Mark R.,Perez Christopher E.,Phan Anthony M.,Seidleck Christina M.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Fragmented High-Energy Heavy-Ion Beams for Electronics Testing;IEEE Transactions on Nuclear Science;2023-04

2. Scaling Trends of Digital Single-Event Effects: A Survey of SEU and SET Parameters and Comparison With Transistor Performance;IEEE Transactions on Nuclear Science;2021-02

3. Heavy Ion Nuclear Reaction Impact on SEE Testing: From Standard to Ultra-high Energies;IEEE Transactions on Nuclear Science;2020-07

4. Swift heavy ion track formation in SrTiO3and TiO2under random, channeling and near-channeling conditions;Journal of Physics D: Applied Physics;2017-04-21

5. Influence of edge effects on single event upset susceptibility of SOI SRAMs;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2015-01

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