An Alternate Scattering-Type Parameter for Target Characterization and Classification-Reference-Cited by-同舟云学术

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An Alternate Scattering-Type Parameter for Target Characterization and Classification

Published:2024 Issue: Volume:62 Page:1-14
ISSN:0196-2892
Container-title:IEEE Transactions on Geoscience and Remote Sensing
language:
Short-container-title:IEEE Trans. Geosci. Remote Sensing

Author:

Bhattacharya Avik¹^ORCID,Verma Abhinav¹^ORCID,Dey Subhadip²^ORCID,Frery Alejandro C.³^ORCID

Affiliation:

1. Microwave Remote Sensing Laboratory, Center of Studies in Resources Engineering, Indian Institute of Technology Bombay, Mumbai, India

2. Agricultural and Food Engineering Department, Indian Institute of Technology Kharagpur, Kharagpur, West Bengal, India

3. School of Mathematics and Statistics, Victoria University of Wellington, Wellington, New Zealand

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx7/36/10354519/10399865.pdf?arnumber=10399865

Reference29 articles.

1. PHENOMENOLOGICAL THEORY OF RADAR TARGETS

2. Polarimetric Radar Imaging

3. New decomposition of the radar target scattering matrix

4. Simulated polarimetric signatures of primitive geometrical shapes

5. Characterization of target symmetric scattering using polarimetric SARs

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Enhanced Target Characterization with Dual-Pol Sentinel-1 SAR Data;IGARSS 2024 - 2024 IEEE International Geoscience and Remote Sensing Symposium;2024-07-07

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