<formula formulatype="inline"><tex>$1/f$</tex></formula> Electrical Noise in Planar Resistors: The Joint Effect of a Backgating Noise and an Instrumental Disturbance-Reference-Cited by-同舟云学术

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$1/f$ Electrical Noise in Planar Resistors: The Joint Effect of a Backgating Noise and an Instrumental Disturbance

Published:2008-03 Issue:3 Volume:57 Page:509-517
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Izpura J.-I.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx5/19/4447379/04413160.pdf?arnumber=4413160

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Low-Frequency Noise after Temperature Treatment in Carbon-Based Thick-Film Resistor;2024 IEEE 25th International Conference of Young Professionals in Electron Devices and Materials (EDM);2024-06-28

2. Mutual inductive magnetic sensor consisting of a pair of coplanar parallel winding spiral coils sandwiched by soft magnetic ribbons;Journal of Magnetism and Magnetic Materials;2022-01

3. Peculiarities of Hardware for Electrochemical Noise Measurement in Chemical Power Sources;IEEE Transactions on Instrumentation and Measurement;2019-11

4. Radiofrequency characteristics of ionized sputtered tantalum nitride thin-film resistor in CMOS device;Electronic Materials Letters;2017-05

5. Surface-Assisted Luminescence: The PL Yellow Band and the EL of n-GaN Devices;Advances in Condensed Matter Physics;2013

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