Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies-Reference-Cited by-同舟云学术

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Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies

Published:2021-10 Issue: Volume: Page:
ISSN:
Container-title:2021 IEEE International Test Conference (ITC)
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Author:

Sato Keno,Ishida Takashi,Okamoto Toshiyuki,Ichikawa Tamotsu,Wei Jianglin,Nakatani Takayuki,Zhao Yujie,Katayama Shogo,Yamamoto Shuhei,Kuwana Anna,Hatayama Kazumi,Kobayashi Haruo

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9611037/9611298/09611332.pdf?arnumber=9611332

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. ADC Dynamic Parameter Testing Scheme Under Relaxed Conditions;Journal of Electronic Testing;2024-07-17

2. Model for Choosing the Shape Parameter in the Multiquadratic Radial Basis Function Interpolation of an Arbitrary Sine Wave and Its Application;Mathematics;2023-04-13

3. How the Author's Group Came Up with Ideas in Analog/Mixed-Signal Circuit and System Area;IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences;2023

4. Challenges for Waveform Sampling and Related Technologies;2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT);2022-10-25

5. Research on Cosine-Sum Windows with Maximum Side-Lobe Decay for High Precision ADC Spectral Testing;Electronics;2022-06-29

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