Large-signal characterization of dual-gate field effect transistors using load-pull measurements
-
Published:1993
Issue:2
Volume:41
Page:183-189
-
ISSN:0018-9480
-
Container-title:IEEE Transactions on Microwave Theory and Techniques
-
language:
-
Short-container-title:IEEE Trans. Microwave Theory Techn.
Author:
Drury D.M.,Zimmermann D.C.,Davis W.A.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Radiation