Phenology-based crop classification from multi-frequency dual-pol SAR data utilizing Gaussian Processes-Reference-Cited by-同舟云学术

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Phenology-based crop classification from multi-frequency dual-pol SAR data utilizing Gaussian Processes

Published:2023-10-23 Issue: Volume:9 Page:1-6
ISSN:
Container-title:2023 8th Asia-Pacific Conference on Synthetic Aperture Radar (APSAR)
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Author:

Ghosh Swarnendu Sekhar¹,Mandal Dipankar²,Kumar Sandeep¹,Bhagapurapu Narayanarao³,Siqueira Paul³,Banerjee Biplab⁴,Bhattacharya Avik¹

Affiliation:

1. Indian Institute of Technology Bombay,Microwave Remote Sensing Lab (MRSLab) CSRE,Mumbai,India

2. Kansas State University,Department of Agronomy,Manhattan,KS,USA,66506

3. University of Massachusetts,Department of Electrical and Computer Engineering,Amherst,MA,USA

4. Indian Institute of Technology Bombay,Centre of Studies in Resources Engineering (CSRE),Mumbai,India

Funder

European Space Agency

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10388487/10388509/10388965.pdf?arnumber=10388965

Reference17 articles.

1. Kernels for Vector-Valued Functions: A Review

2. A new method for crop classification combining time series of radar images and crop phenology information

3. Combination of Time Series of L-, C-, and X-Band SAR Images for Land Cover and Crop Classification

4. A Survey on Gaussian Processes for Earth-Observation Data Analysis: A Comprehensive Investigation

5. Gaussian Process Regression Model for Crop Biophysical Parameter Retrieval from Multi-Polarized C-Band SAR Data

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