An Interconnecting Technology for RF MEMS Heterogeneous Chip Integration

Author:

Chao Tzu-Yuan,Li Chun-Hsing,Chen Yang Chuan,Chen Hsin-Yu,Cheng Yu-Ting,Kuo Chien-Nan

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. In‐Situ Observation of Atomic Diffusion at Epitaxial Al–Si Interface;physica status solidi (RRL) – Rapid Research Letters;2024-07-26

2. A review of research on RF MEMS for metaverse interactions;Journal of Micromechanics and Microengineering;2024-07-25

3. Reliability Enhancement by Doping Boron and Fluorine in Lightly Doped Drain Region of High-Voltage FinFET;IEEE Electron Device Letters;2023-06

4. Lithography process optimization to realize RDL layers on high topography wafers for heterogeneous integration;2022 IEEE 24th Electronics Packaging Technology Conference (EPTC);2022-12-07

5. Optimization of annealing process to realize RDL layers on high topography wafer for heterogeneous integration;2022 IEEE 24th Electronics Packaging Technology Conference (EPTC);2022-12-07

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