Systematic Investigation on Deposition Temperature Effect of Ni1–xO Thin Films for Uncooled Infrared Image Sensor Applications-Reference-Cited by-同舟云学术

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Systematic Investigation on Deposition Temperature Effect of Ni1–xO Thin Films for Uncooled Infrared Image Sensor Applications

Published:2015-12 Issue:12 Volume:15 Page:7234-7241
ISSN:1530-437X
Container-title:IEEE Sensors Journal
language:
Short-container-title:IEEE Sensors J.

Author:

Kang In-Ku,Reddy Y. Ashok Kumar,Shin Young Bong,Lee Hee Chul

Funder

Chungcheong Institute for Regional Program Evaluation through the Ministry of Trade, Industry and Energy, Korea

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/7361/7286895/07229248.pdf?arnumber=7229248

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Tailoring bolometric properties of a TiOx/Ti/TiOx tri-layer film for integrated optical gas sensors;Optics Express;2021-05-25

2. Pixel Dark Current Calibration Method to Reduce Dark Fixed Pattern Noise in Amorphous Silicon Bolometer-type Uncooled Infrared Image Sensor;Sensors and Materials;2020-10-20

3. Anodic Aluminum Oxide-Based IR Emitter for High-Speed Infrared Scene Projector;Journal of Microelectromechanical Systems;2019-12

4. Control of the structural, electrical and optical properties of spin coated NiO films by varying precursor molarity;Thin Solid Films;2019-11

5. Effect of film thickness on humidity sensing of spray deposited TiO2 thin films;Materials Research Express;2018-11-02

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