Quantitative MFM study of the global and local magnetic roughness of the DC-demagnetized state of thin film media
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Published:1998-07
Issue:4
Volume:34
Page:1549-1551
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ISSN:0018-9464
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Container-title:IEEE Transactions on Magnetics
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language:
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Short-container-title:IEEE Trans. Magn.
Author:
Xing Song ,Qixu Chen ,Leu C.,Ranjan R.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Cited by
1 articles.
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1. Magnetic force microscopy;Modern Techniques for Characterizing Magnetic Materials