Hot-Carrier Effect and Nanometer Metal Enabling Si-Based Mid-Infrared Detection Beyond 5μm of Wavelength
Author:
Affiliation:
1. Graduate Institute of Photonics and Optoelectronics, National Taiwan University, Taipei, Taiwan
Funder
Ministry of Science and Technology
National Science and Technology Council
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Link
http://xplorestaging.ieee.org/ielx7/4563994/10504673/10517374.pdf?arnumber=10517374
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5. High-resolution, high-contrast mid-infrared imaging of fresh biological samples with ultraviolet-localized photoacoustic microscopy
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