Suppression of crack formation in garnet film by using a compound glass underlayer-Reference-Cited by-同舟云学术

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Suppression of crack formation in garnet film by using a compound glass underlayer

Published:2001-07 Issue:4 Volume:37 Page:2407-2410
ISSN:0018-9464
Container-title:IEEE Transactions on Magnetics
language:
Short-container-title:IEEE Trans. Magn.

Author:

Furuya A.,Baubet C.,Yoshikawa H.,Tanabe T.,Yamamoto M.,Tailhades P.,Bouet L.,Despax C.,Presmanes L.,Rousset A.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/20/20571/00951187.pdf?arnumber=951187

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Tens of micron-thick, crack-free yttrium iron garnet films on a Gd3Ga5O12 substrate based on the layer by layer growth method;Journal of Materials Science: Materials in Electronics;2018-05-12

2. Magnetooptical and crystalline properties of sputtered garnet ferrite film using a stress relaxation buffer layer;Japanese Journal of Applied Physics;2015-08-12

3. Stress Engineering and Optimization of Thick Garnet Crystal Films Grown by Pulsed Laser Deposition;Crystal Growth & Design;2011-03-09

4. Effects of off-stoichiometry and density on the magnetic and magneto-optical properties of yttrium iron garnet films by magnetron sputtering method;Journal of Applied Physics;2010-10

5. Garnet Films for Thermo-Magnetic Recording and Nanotechnology Purposes;Solid State Phenomena;2009-04

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