Soft error rate increase for new generations of SRAMs
Author:
Affiliation:
1. Electromagn. Technol. Div., Saab Avionics AB, Linkoping, Sweden
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Link
http://xplorestaging.ieee.org/ielx5/23/28269/01263843.pdf?arnumber=1263843
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