Electrical characterization of plastic encapsulations using an alternative gate leakage test method-Reference-Cited by-同舟云学术

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Electrical characterization of plastic encapsulations using an alternative gate leakage test method

Published:2008-04 Issue: Volume: Page:
ISSN:
Container-title:2008 IEEE International Reliability Physics Symposium
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Author:

van Soestbergen M.,Rongen R.T.H.,Knol J.,Mavinkurve A.,Egbers J.H.,Nath S.,Zhang G.Q.,Ernst L.J.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/4550747/4558854/04558929.pdf?arnumber=4558929

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